Skip to content

Syllabus Index and Coverage

Codes shown in backticks, such as AExE0101 and AEiE0601, are the official NEC syllabus identifiers. They are retained only to map each note to its source topic.

Status key

Status Meaning
TODO Chapter note not started
DRAFT Syllabus atoms covered but technical verification is incomplete
VERIFIED Syllabus atoms and model-paper targets checked against listed sources
REVISED Verified note condensed and studied at least once

Progress

  • Verified subchapters: 6 / 60
  • Drafted subchapters: 60 / 60
  • Modules 1-9 with syllabus-atom and assigned-question passes: 9 / 9
  • Assigned questions mapped to deciding facts for Modules 1-9: 90 / 90
  • Independently verified chapter: 01 - Basic Electrical and Electronics
  • Chapters 2-9 remain DRAFT until their source-by-source technical audits are complete.
  • Chapter 10 is outside the current completion scope and remains DRAFT.

Syllabus coverage

Chapter Code Subchapter Status
1 AExE0101 Basic concept VERIFIED
1 AExE0102 Network theorems VERIFIED
1 AExE0103 Alternating-current fundamentals VERIFIED
1 AExE0104 Semiconductor devices VERIFIED
1 AExE0105 Signal generator VERIFIED
1 AExE0106 Amplifiers VERIFIED
2 AExE0201 Digital logic DRAFT
2 AExE0202 Combinational and arithmetic circuits DRAFT
2 AExE0203 Sequential logic circuit DRAFT
2 AExE0204 Microprocessor DRAFT
2 AExE0205 Microprocessor system DRAFT
2 AExE0206 Interrupt operations DRAFT
3 ACtE0301 Introduction to C programming DRAFT
3 ACtE0302 Pointers, structures, and data files in C DRAFT
3 ACtE0303 C++ constructs with objects and classes DRAFT
3 ACtE0304 Object-oriented programming features DRAFT
3 ACtE0305 Pure virtual functions and file handling DRAFT
3 ACtE0306 Generic programming and exception handling DRAFT
4 ACtE0401 Control and central processing units DRAFT
4 ACtE0402 Computer arithmetic and memory system DRAFT
4 ACtE0403 Input-output organization and multiprocessors DRAFT
4 ACtE0404 Embedded-system hardware-software design DRAFT
4 ACtE0405 Real-time operating and control systems DRAFT
4 ACtE0406 Hardware description language and IC technology DRAFT
5 ACtE0501 Networks and the physical layer DRAFT
5 ACtE0502 Data-link layer DRAFT
5 ACtE0503 Network layer DRAFT
5 ACtE0504 Transport layer DRAFT
5 ACtE0505 Application layer DRAFT
5 ACtE0506 Network security DRAFT
6 AEiE0601 Electric and magnetic fields DRAFT
6 AEiE0602 Wave propagation and antennas DRAFT
6 AEiE0603 Communication systems DRAFT
6 AEiE0604 Data communication and information theory DRAFT
6 AEiE0605 Signals and systems DRAFT
6 AEiE0606 Digital signal processing DRAFT
7 AEiE0701 Data structures and algorithms DRAFT
7 AEiE0702 Sorting, searching, and graphs DRAFT
7 AEiE0703 Data modeling DRAFT
7 AEiE0704 Transactions, concurrency, and recovery DRAFT
7 AEiE0705 Operating systems and process management DRAFT
7 AEiE0706 Memory, files, and system administration DRAFT
8 AEiE0801 Finite automata DRAFT
8 AEiE0802 Context-free language DRAFT
8 AEiE0803 Turing machine DRAFT
8 AEiE0804 Computer graphics DRAFT
8 AEiE0805 Two-dimensional transformation DRAFT
8 AEiE0806 Three-dimensional transformation DRAFT
9 AEiE0901 Telecommunication and wireless communication DRAFT
9 AEiE0902 Equalization and diversity techniques DRAFT
9 AEiE0903 Switching systems and traffic engineering DRAFT
9 AEiE0904 Data-communication switching techniques DRAFT
9 AEiE0905 IP switching DRAFT
9 AEiE0906 Soft switching DRAFT
10 AALL1001 Engineering drawings DRAFT
10 AALL1002 Engineering economics DRAFT
10 AALL1003 Project planning and scheduling DRAFT
10 AALL1004 Project management DRAFT
10 AALL1005 Engineering professional practice DRAFT
10 AALL1006 Engineering regulatory body DRAFT

Chapter 1 atomic coverage

AExE0101 Basic concept

  • Ohm's law and its validity condition
  • Charge, current, voltage, power, and energy
  • Conductors and insulators
  • Series and parallel circuits
  • Star-delta and delta-star conversion
  • Kirchhoff's current and voltage laws
  • Nodal versus mesh recognition
  • Linear versus nonlinear circuits
  • Bilateral versus unilateral circuits
  • Active versus passive circuits and devices

AExE0102 Network theorems

  • Superposition and source deactivation
  • Thevenin equivalent
  • Norton equivalent
  • Thevenin-Norton conversion
  • Maximum power transfer and efficiency caveat
  • RC and RL first-order transients
  • RLC impedance and phase
  • Series and parallel resonance
  • Active, reactive, and apparent power
  • Power factor and the power triangle

AExE0103 Alternating-current fundamentals

  • AC generation and sinusoidal equation
  • Frequency, period, angular frequency, and phase
  • Peak, peak-to-peak, full-cycle average, and rectified average
  • RMS definition and sinusoidal value
  • Peak factor and form factor
  • Nepal nominal grid frequency
  • Balanced three-phase generation
  • Star and delta line/phase relationships
  • Balanced three-phase power

AExE0104 Semiconductor devices

  • PN diode operation and V-I characteristic
  • Forward drop and breakdown caveats
  • BJT regions and configurations
  • Bias and quiescent point
  • Small-signal versus large-signal model
  • Enhancement and depletion MOSFETs
  • MOSFET cutoff, triode, and saturation regions
  • MOSFET versus CMOS
  • CMOS inverter and static/dynamic power distinction

AExE0105 Signal generator

  • Oscillator feedback principle
  • Barkhausen sustained/startup distinction
  • RC phase-shift oscillator
  • Wien bridge oscillator
  • Hartley and Colpitts LC oscillators
  • Crystal oscillator and quality factor
  • Sinusoidal versus relaxation oscillators
  • Square, triangle, and sawtooth generation

AExE0106 Amplifiers

  • Output-stage purpose and classification
  • Class A, B, and AB conduction and bias
  • Efficiency limits with topology caveats
  • Crossover distortion and Class AB bias
  • Power BJT ratings and thermal concerns
  • Push-pull operation
  • Transformer-coupled push-pull stages
  • Tuned amplifiers
  • Ideal and practical op-amp properties
  • Inverting, noninverting, follower, and comparator recognition

Model-set traceability

The Chapter 1 note supports the knowledge tested by:

set1-001 through set1-006, and set1-061 through set1-064.

Question wording and answer keys remain diagnostic evidence, not technical sources.